Phase Identification

X-rays scatter from crystalline materials in such a way to produce a unique X-ray Diffraction Pattern. By extracting the peak positions and intensities from this pattern, we can identify and quantify the amount of each phase present in the test sample. To aid in this endeavor, many advanced analytical techniques, such as Rietveld refinement have been developed to improve the accuracy.

Several hundred thousand materials have been catalogued in various diffraction databases allowing us to identify both inorganic and organic substances.

Among the common uses of this technology are:

  • Identification and quantification of multi-phase materials
  • Detection of pharmaceutical polymorphs
  • Analysis of cement and clinker phases
  • Identification of precipitates in metallic alloys
  • Analysis of corrosion products
  • Reverse engineering of competitor’s products
  • Detection of trace impurities down to 0.1 weight percent
  • Identification of silica forms in work environment such as respirable quartz
  • Analysis of erionite and asbestos in mineral deposits
  • Soil analysis
  • Verification of process streams
  • Use in quality control and validation such as Hydroxyapetite
  • Identification of catalyst phases
  • Forensic matching of investigative materials